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ABOUT US
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MANAGEMENT
Director
Deputy Director
Board Of Directors
Boards And Commissions
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Administrative Staff
DEVICES
Field Emission Scanning Electron Microscope (FESEM)
X-Ray Difractometer (XRD)
X-Ray Fluorescence Spectrometer (WD/XRF)
Atomic Force Microscope (AFM)
Thermogravimetric And Differantial Thermal Analysis Device (TG/DTA)
Dynamic Mechanical Analysis Device (DMA)
Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
Gas Chromatography–Mass Spectrometry (GS-MS)
High Performance Liquid Chromatography (HPLC)
Nuclear Magnetic Resonance Spectrometer (NMR)
FT-IR Spectrometer and IR Microscope (FT-IR)
Surface Area And Porosity Analyzer (BET)
Density Measuring Device
Liquid Nitrogen Production System
Tensile - Compression Tester
Micro And Macro Hardness Testing Devices
Shore A and Shore D Hardness Measuring Devices
Air Permeability Tester
Thermal Parameters Measurement Device
Sample Preparation Devices
ANALYSIS PROCEDURES
Analysis Prices
Analysis Request Forms
Bank information
DOCUMENTS
Activity Reports
Publications
CONTACT
TR
EN
ABOUT US
About Us
Vision and Mission
Regulations
MANAGEMENT
Director
Deputy Director
Board Of Directors
Boards And Commissions
Lecturers
Administrative Staff
DEVICES
Field Emission Scanning Electron Microscope (FESEM)
X-Ray Difractometer (XRD)
X-Ray Fluorescence Spectrometer (WD/XRF)
Atomic Force Microscope (AFM)
Thermogravimetric And Differantial Thermal Analysis Device (TG/DTA)
Dynamic Mechanical Analysis Device (DMA)
Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
Gas Chromatography–Mass Spectrometry (GS-MS)
High Performance Liquid Chromatography (HPLC)
Nuclear Magnetic Resonance Spectrometer (NMR)
FT-IR Spectrometer and IR Microscope (FT-IR)
Surface Area And Porosity Analyzer (BET)
Density Measuring Device
Liquid Nitrogen Production System
Tensile - Compression Tester
Micro And Macro Hardness Testing Devices
Shore A and Shore D Hardness Measuring Devices
Air Permeability Tester
Thermal Parameters Measurement Device
Sample Preparation Devices
ANALYSIS PROCEDURES
Analysis Prices
Analysis Request Forms
Bank information
DOCUMENTS
Activity Reports
Publications
CONTACT
Atomic Force Microscopy
Field-Emission Scanning Electron Microscopy (FESEM)
Erciyes Universty Technology Research And Application Center (TAUM)
ANNOUNCEMENTS
22
February
2022
Unsigned and Incomplete Analysis Request Forms will not be accepted.
22
February
2022
Samples without Analysis Request Form will not be accepted.
22
February
2022
Our Price List for the Year 2022 has been updated....
22
February
2022
Our web page has started broadcasting with its new image.
NEWS
03 January 2022
Success of Lecturer Mehmet Çadır
Our Center Lecturer Mehmet Çadır has received a patent for his study named "PENICILLIN DERIVATIVES AND METHOD FOR THEIR SYNTHESIS". We congratulate him and wish him success in his work. https:avesis.erciyes.edu.trfikrimulkiyet82f03fb7-7298-4ae7- ...
22 February 2022
Our Web Page Has Been Updated.
Our Web Page Has Been Updated.
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