FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM)

Brand: ZEISS

Model: GEMINI 500

Detectors:

Inlens - SE - BSE - EBS - STEM and analysis detector EDS Microstructure Characterization

Analysis of defects found in material surface and cross-section

Particle Size Analysis

Coating Morphology/Interface studies

Polymer material broken surface detection

Damage Analysis

Micro-Chemical Analysis (Qualitative/Semi-Quantitative)

Thin film thickness determination

EDS mapping

EDS Point and Linear Analysis

Cell/tissue imaging