Sample Preparation Devices
DEVICES
- Field Emission Scanning Electron Microscope (FESEM)
- X-Ray Difractometer (XRD)
- X-Ray Fluorescence Spectrometer (WD/XRF)
- Atomic Force Microscope (AFM)
- Thermogravimetric And Differantial Thermal Analysis Device (TG/DTA)
- Dynamic Mechanical Analysis Device (DMA)
- Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
- Gas Chromatography–Mass Spectrometry (GS-MS)
- High Performance Liquid Chromatography (HPLC)
- Nuclear Magnetic Resonance Spectrometer (NMR)
- FT-IR Spectrometer and IR Microscope (FT-IR)
- Surface Area And Porosity Analyzer (BET)
- Density Measuring Device
- Liquid Nitrogen Production System
- Tensile - Compression Tester
- Micro And Macro Hardness Testing Devices
- Shore A and Shore D Hardness Measuring Devices
- Air Permeability Tester
- Thermal Parameters Measurement Device
- Sample Preparation Devices
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pH Meter |
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Critical Point Drier |
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Microtom |
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