X-Ray Fluorescence Spectrometer (WD/XRF)

DEVICES

Field Emission Scanning Electron Microscope (FESEM)
X-Ray Difractometer (XRD)
X-Ray Fluorescence Spectrometer (WD/XRF)
Atomic Force Microscope (AFM)
Thermogravimetric And Differantial Thermal Analysis Device (TG/DTA)
Dynamic Mechanical Analysis Device (DMA)
Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
Gas Chromatography–Mass Spectrometry (GS-MS)
High Performance Liquid Chromatography (HPLC)
Nuclear Magnetic Resonance Spectrometer (NMR)
FT-IR Spectrometer and IR Microscope (FT-IR)
Surface Area And Porosity Analyzer (BET)
Density Measuring Device
Liquid Nitrogen Production System
Tensile - Compression Tester
Micro And Macro Hardness Testing Devices
Shore A and Shore D Hardness Measuring Devices
Air Permeability Tester
Thermal Parameters Measurement Device
Sample Preparation Devices

X-RAY FLUORESCENCE SPECTROMETER (WD/XRF)

Brand: Panalytical

Model: Axios Advanced

All elements from Boron (B) to Uranium (U) are in a concentration range from sub. ppm level to 100% levelAll elements from Boron (B) to Uranium (U), sub. Concentration range from ppm to 100%

* Solid (mineral, metal, polymer),

* Liquid (water, oil, petroleum products),

* Semi-quantitative elementary analysis can be performed on samples in any form, such as thin film and pressed powder, without the need for a standard sample set.

Quantitative analysis in clay, ceramic and cement groups with Wroxi standard set