X-RAY DIFRACTOMETER (XRD)

Brand: Panalytical

Model: Empyrean

The X-Ray Diffraction method (XRD) is based on the principle that each crystal phase refracts X-rays in a characteristic pattern depending on their unique atomic arrangement. For each crystal phase, these diffraction patterns define that crystal, sort of like a fingerprint. X-Ray Diffraction analysis method does not destroy the sample during analysis and allows analysis of even very small samples. Qualitative and quantitative investigations of rocks, crystalline materials, thin films and polymers can be made with the X-Ray Diffraction device. Thanks to the high temperature furnace that can reach up to 1200 oC, it is possible to see the phase changes in the crystal structure in the atmosphere, vacuum and inert gas environment.

Analyses with XRD give information about the following:

- The phases in powder, solid and thin film samples,

- The amount of phases, - crystal size,

- Lattice parameters,

- Changes in the structure,

- Crystal orientation atomic positions.